The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Sep. 27, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Karthik Gvd, Bengaluru, IN;
Utkarsh Milind Desai, Bangalore, IN;
Vijayalakshmi Krishnamurthy, Sunnyvale, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Embodiments determine anomalies in sensor data generated by a sensor by receiving an evaluation time window of clean sensor data generated by the sensor. Embodiments receive a threshold value for determining anomalies. When the clean sensor data has a cyclic pattern, embodiments divide the evaluation time window into a plurality of segments of equal length, wherein each equal length comprises the cyclic pattern. When the clean sensor data does not have the cyclic pattern, embodiments divide the evaluation time window into a pre-defined number of plurality of segments of equal length. Embodiments convert the evaluation time window and each of the plurality of segments into corresponding curves using Kernel Density Estimation ('KDE'). For each of the plurality of segments, embodiments determine a Kullback-Leibler ('KL') divergence value between corresponding curves of the segment and the evaluation time window to generate a plurality of KL divergence values.