The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jan. 29, 2019
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Hyun Woo Kim, Daejeon, KR;

Ho Young Jung, Daejeon, KR;

Jeon Gue Park, Daejeon, KR;

Yun Keun Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06F 3/06 (2006.01); G06N 3/08 (2006.01); H03H 17/02 (2006.01);
U.S. Cl.
CPC ...
G06N 3/0472 (2013.01); G06F 3/0604 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06N 3/0445 (2013.01); G06N 3/08 (2013.01); H03H 17/0257 (2013.01);
Abstract

Provided are an apparatus and method for a statistical memory network. The apparatus includes a stochastic memory, an uncertainty estimator configured to estimate uncertainty information of external input signals from the input signals and provide the uncertainty information of the input signals, a writing controller configured to generate parameters for writing in the stochastic memory using the external input signals and the uncertainty information and generate additional statistics by converting statistics of the external input signals, a writing probability calculator configured to calculate a probability of a writing position of the stochastic memory using the parameters for writing, and a statistic updater configured to update stochastic values composed of an average and a variance of signals in the stochastic memory using the probability of a writing position, the parameters for writing, and the additional statistics.


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