The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Aug. 30, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takuma Shibahara, Tokyo, JP;

Mayumi Suzuki, Tokyo, JP;

Ken Naono, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

Facilitation of an explanation about an object to be analyzed is realized with high accuracy and with efficiency. A data analysis apparatus is disclosed which uses a first neural network configured with an input layer, an output layer, and two or more intermediate layers provided between the input layer and the output layer. Each performs a calculation by giving data from a layer of a previous stage and a first learning parameter to a first activation function and outputs a calculation result to a layer of a subsequent stage. The data analysis apparatus includes a conversion section; a reallocation section; and an importance calculation section.


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