The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

May. 28, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Christopher Lee Weider, Redmond, WA (US);

Ruth Kikin-Gil, Bellevue, WA (US);

Harsha Prasad Nori, Seattle, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6264 (2013.01); G06K 9/6256 (2013.01); G06K 9/6265 (2013.01); G06N 20/00 (2019.01);
Abstract

A method and system for performing semi or fully automatic data imbalance detection and correction in training a machine-learning (ML) model includes receiving a request to train the ML model, receiving access to a dataset for use in training the ML model, identifying a feature of the dataset for which data imbalance detection is to be performed, examining the dataset to determine a distribution of the feature across the dataset, determining if the distribution of the feature across the dataset indicates data imbalance, upon determining that the distribution of the feature across the dataset indicates data imbalance, identifying a desired distribution for the identified feature, selecting a subset of the dataset that corresponds with the selected feature and the desired distribution, and using the subset to train the ML model.


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