The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jul. 13, 2018
Accenture Global Solutions Limited, Dublin, IE;
Ramkumar Kothandaraman, Bangalore, IN;
Koduvayur Vaidyanathan Ramesh, Bangalore, IN;
Puneet Kalra, Bangalore, IN;
Sunil Balugari, Bangalore, IN;
Sudeep Sharma, Bangalore, IN;
Sachin Premnath, Bangalore, IN;
ACCENTURE GLOBAL SOLUTIONS LIMITED, Dublin, IE;
Abstract
An AI-based process monitoring system access a plurality of data sources having different data formats to collect and analyze KPI data and shortlist KPIs that are to be used for determining the impact of automation of an automated process or sub-process. Information regarding an automated process is received and KPIs associated with the process and sub-processes of the process are identified. The identified KPIs are put through an approval process and the approved KPIs are presented to a user for selection. The user-selected KPIs are evaluated based on classification, ranking and sentiments associated therewith. The evaluations are again presented to the user along with a set of questionnaires wherein each of the questions has a dynamically controlled weight associated therewith. Based at least on the weights and user responses, a subset of the evaluated KPIs are shortlisted for use in evaluating the impact of process automation.