The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Mar. 31, 2020
Applicants:

International Business Machines Corporation, Armonk, NY (US);

The University of Southern California, Los Angeles, CA (US);

Inventors:

Hongzhi Wang, San Jose, CA (US);

Tanveer Fathima Syeda-Mahmood, Cupertino, CA (US);

John Paul Francis, Los Angeles, CA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06K 9/62 (2022.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6259 (2013.01); G06K 9/6232 (2013.01); G06N 3/0472 (2013.01); G06N 3/08 (2013.01); G06V 2201/031 (2022.01);
Abstract

Methods and systems for training a model labeling two or more organic structures within an image. One method includes receiving a set of training images. The set of training images including a first plurality of images and a second plurality of images. Each of the first plurality of images including a label for each of the two or more organic structures and each of the second plurality of images including a label for only a subset of the two or more organic structures. The method further includes training the model using the first plurality of images, the second plurality of images, and a label merging function mapping a label from the first plurality of images to a label included in the second plurality of images.


Find Patent Forward Citations

Loading…