The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jul. 30, 2020
Applicant:

Aspentech Corporation, Bedford, MA (US);

Inventors:

Jian Ma, Lexington, MA (US);

Chen Yang, Watertown, MA (US);

Hong Zhao, Sugar Land, TX (US);

Mark-John Bruwer, Richmond, TX (US);

Timothy Lim, Braintree, MA (US);

Assignee:

AspenTech Corporation, Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06F 16/28 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/41835 (2013.01); G06F 16/285 (2019.01); G06N 20/00 (2019.01); G05B 2219/31449 (2013.01); G05B 2219/32396 (2013.01);
Abstract

Computer-based methods and systems provide automated batch data alignment for a batch production industrial process. An example embodiment selects a reference batch from batch data for a subject industrial process and configures batch alignment settings. In turn, a seed model configured to predict alignment quality given settings for one or more alignment hyperparameters is constructed. Collectively the selected reference batch, the configured batch alignment settings, the constructed seed model, and a set of representative batches, representative of the batch data for the industrial process, are used to perform at least one of: (i) automated active learning, (ii) interactive active learning, and (iii) guided learning to determine settings for the one or more alignment hyperparameters. Then, a batch alignment is performed using the determined settings for the one or more alignment hyperparameters and the configured batch alignment settings. The resulting aligned batch data of the subject industrial process enables improved modeling and control of batch productions by the subject industrial process.


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