The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Oct. 21, 2020
Applicant:
Illumina, Inc., San Diego, CA (US);
Inventors:
Bo Lu, San Diego, CA (US);
Robert Ezra Langlois, San Diego, CA (US);
Andrew James Young, San Diego, CA (US);
Andrew Dodge Heiberg, San Diego, CA (US);
Assignee:
Illumina, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 27/60 (2006.01); G01N 21/64 (2006.01); G06T 3/40 (2006.01); G02B 21/14 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/14 (2013.01); G02B 27/60 (2013.01); G06T 3/4053 (2013.01); G06T 5/50 (2013.01); G01N 2021/6439 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20024 (2013.01); G06T 2207/20056 (2013.01);
Abstract
The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps.