The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jul. 26, 2018
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Yoshihiro Yamashita, Tokyo, JP;

Takenori Okusa, Tokyo, JP;

Shunsuke Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 33/543 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); G01N 33/543 (2013.01); G01N 35/0098 (2013.01); G01N 35/025 (2013.01); G01N 2035/00356 (2013.01);
Abstract

An object is to provide an automatic analyzer that prevents an effect of various environmental changes on an equilibrium state of an immunological binding reaction. An automatic analyzer of an embodiment of the invention includes a B/F separation unit that executes a B/F separation step separating an unreacted component and a reacted component from a liquid in which a sample and a reagent are reacted, a detection unit that detects a reacted component in the liquid after the B/F separation step, and a temperature maintaining unit that maintains the B/F separation unit and the detection unit in substantially the same temperature environment.


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