The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Dec. 18, 2017
Applicants:

Ueda Japan Radio Co., Ltd., Ueda, JP;

Japan Radio Co., Ltd., Mitaka, JP;

Nisshinbo Holdings Inc., Tokyo, JP;

Inventors:

Osamu Sakaguchi, Ueda, JP;

Isao Ito, Ueda, JP;

Yasuhiro Toriyama, Mitaka, JP;

Katsuyuki Matsubayashi, Tokyo, JP;

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/32 (2006.01); G01N 29/024 (2006.01);
U.S. Cl.
CPC ...
G01N 29/326 (2013.01); G01N 29/024 (2013.01); G01N 2291/021 (2013.01);
Abstract

A variable value calculating process includes: measuring a propagation time of the propagation of an ultrasound wave through a measurement sector inside a housing; obtaining a temperature calculated value on the basis of the measured value of the propagation time and a reference distance for the measurement sector; obtaining a temperature measured value by measuring the temperature inside the housing; and obtaining a temperature replacement fluctuation value indicating a difference between the temperature calculated value and the temperature measured value. The variable value calculating process is executed for each of a plurality of temperature conditions under which the temperature of a reference gas inside the housing differs. A temperature compensation table in which the temperature of a gas to be measured is associated with a temperature compensation value relating to the temperature is obtained on the basis of the temperature replacement fluctuation values obtained under each temperature condition.


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