The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Dec. 28, 2018
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yao-Long Tsai, Hsinchu, TW;

Tai-Ping Tsai, Hsinchu, TW;

Li-Hua Wang, Hsinchu, TW;

Yi-Tsung Pan, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/44 (2006.01); G01N 29/11 (2006.01); G01N 29/04 (2006.01); G01N 29/48 (2006.01); G01N 29/46 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/043 (2013.01); G01N 29/11 (2013.01); G01N 29/4427 (2013.01); G01N 29/46 (2013.01); G01N 29/48 (2013.01); G01N 2291/014 (2013.01); G01N 2291/0289 (2013.01);
Abstract

A sound source device and a signal receiver are disposed at first and second ports of a target object, respectively. A sound of a specific frequency of the sound source device is introduced into the target object to generate a resonant sound wave. A computer simulates a signal generated when the resonant sound wave is received by the signal receiver and regarding the signal as reference information. The reference information comprises first data having characteristics of the resonant sound wave, and data having features of an imaginary defect formed on the target object. The features of the imaginary defect correspond to the characteristics of the resonant sound wave. When the target object has a real defect, the sound of the specific frequency of the sound source device is introduced into the target object. Features of the real defect are derived by comparing the first data with the second data.


Find Patent Forward Citations

Tsai, Yao-Long. (2022). Detection system and detection method (U.S. Patent No. 11525811). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11525811

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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