The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Feb. 20, 2020
The Boeing Company, Chicago, IL (US);
Barry A. Fetzer, Renton, WA (US);
Jill P. Bingham, Seattle, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Multi-centric radius focusing is used to inspect a radiused surface of a radiused part having a varying radius without mechanically adjusting the array sensor. A plurality of focal laws are designed to electronically steer and focus ultrasound at respective focal points corresponding to centers of curvature of a simulated radiused surface having a varying radius. The mechanical probe that carries the array sensor is located to two physical places that are outside of the radiused area and have a spatial relationship that varies less than the radius of the radiused surface varies. As the probe is moved along the radiused part, the probe maintains the array sensor at a constant location relative to the radiused part. As the array sensor scans the radiused part, the array sensor is electronically adjusted to focus at the respective focal points in sequence.