The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jul. 27, 2020
Applicant:

The General Hospital Corporation, Boston, MA (US);

Inventors:

Ralph Weissleder, Peabody, MA (US);

Hakho Lee, Acton, MA (US);

Hyungsoon Im, Peabody, MA (US);

Cesar Castro, Reading, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 15/02 (2006.01); G01N 33/574 (2006.01); G01N 33/569 (2006.01); C12Q 1/70 (2006.01); G03H 1/08 (2006.01); G03H 1/04 (2006.01); G01N 15/06 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4788 (2013.01); C12Q 1/708 (2013.01); G01N 15/0211 (2013.01); G01N 15/0227 (2013.01); G01N 15/06 (2013.01); G01N 15/0612 (2013.01); G01N 33/56972 (2013.01); G01N 33/57407 (2013.01); G01N 33/57411 (2013.01); G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1486 (2013.01); G03H 2001/0447 (2013.01);
Abstract

The disclosure features systems and methods for measuring and diagnosing target constituents bound to labeling particles in a sample. The systems include a radiation source, a sample holder, a detector configured to obtain one or more diffraction patterns of the sample each including information corresponding to optical properties of sample constituents, and an electronic processor configured to, for each of the one or more diffraction patterns: (a) analyze the diffraction pattern to obtain amplitude information and phase information corresponding to the sample constituents; (b) identify one or more particle-bound target sample constituents based on at least one of the amplitude information and the phase information; and (c) determine an amount of at least one of the particle-bound target sample constituents in the sample based on at least one of the amplitude information and the phase information.


Find Patent Forward Citations

Loading…