The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jul. 19, 2018
Applicant:
Battelle Memorial Institute, Richland, WA (US);
Inventors:
Curtis J. Larimer, Richland, WA (US);
Raymond S. Addleman, Benton City, WA (US);
Assignee:
BATTELLE MEMORIAL INSTITUTE, Richland, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/06 (2006.01); G01N 21/45 (2006.01); C12M 1/34 (2006.01); C12M 1/32 (2006.01); C12M 1/00 (2006.01); G01B 9/02055 (2022.01);
U.S. Cl.
CPC ...
C12Q 1/06 (2013.01); G01N 21/45 (2013.01); C12M 1/34 (2013.01); C12M 23/12 (2013.01); C12M 23/22 (2013.01); G01B 9/02055 (2013.01);
Abstract
Described herein are methods, systems, and non-transitory computer-readable media to non-destructively acquire three-dimensional profiles of cellular microbiological samples growing on the surface of a solid growth medium. Acquisitions can be performed by an optical microscope that includes a vertical scanning interferometer. The three-dimensional profiles can enable measurement of sample parameters of microcolonies, which can be made of microbial colony forming units. The methods and systems enable early and rapid detection and quantification of microbes.