The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Dec. 20, 2018
Applicant:

Diagnostics for the Real World, Ltd., San Jose, CA (US);

Inventors:

Philip Stankus, Coldwaltham, GB;

Ivan Hin-Kwan Chew, Alameda, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502 (2013.01); B01L 2300/045 (2013.01); B01L 2300/047 (2013.01); B01L 2300/049 (2013.01); B01L 2300/0663 (2013.01); B01L 2400/0644 (2013.01);
Abstract

A device for analysing a sample comprising a nucleic acid to be captured and detected using a test strip are described. The device comprises a resilient biasing member disposed in an analysis chamber containing the test strip. The resilient biasing member exerts a force against the test strip sufficient to urge it into the sample chamber when it is in communication with the analysis chamber. This ensures that the test strip is reliably introduced into the sample chamber when it is in communication with the analysis chamber. In one embodiment, the sample chamber comprises guide members for guiding the test strip into the sample chamber. A free end of each guide member is shaped to prevent significant rotation of the test strip, so that the test strip is in correct alignment in the sample chamber for automatic reading of the test result, for example by a camera or optical reader.


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