The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Sep. 25, 2019
Applicant:

New York University, New York, NY (US);

Inventors:

Dennis Shasha, New York, NY (US);

Aditya Dhananjay, Brooklyn, NY (US);

Marco Mezzavilla, Brooklyn, NY (US);

Sundeep Rangan, Jersey City, NJ (US);

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); H04W 16/18 (2009.01); H04W 72/04 (2009.01); H04W 16/28 (2009.01);
U.S. Cl.
CPC ...
H04W 72/085 (2013.01); H04W 16/18 (2013.01); H04W 16/28 (2013.01); H04W 72/044 (2013.01);
Abstract

An exemplary system, method and computer-accessible medium for determining a degradation(s) of a wireless link(s) can be provided, which can include, for example, periodically determining a wireless channel quality of the wireless link(s) between a sender and a receiver, recording a history of the wireless channel quality, determining whether a plurality of diffractive pulses are present based on the history and determining the degradation(s) based on the presence of the plurality of diffractive pulses. The wireless channel can be in a beam-forming direction. The degradation(s) can be an impending degradation.


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