The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Aug. 13, 2020
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Zhengzhang Chen, Princeton Junction, NJ (US);

Jiaping Gui, West Windsor Township, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Lei Cai, College Station, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); G06N 3/08 (2013.01);
Abstract

A computer-implemented method for graph structure based anomaly detection on a dynamic graph is provided. The method includes detecting anomalous edges in the dynamic graph by learning graph structure changes in the dynamic graph with respect to target edges to be evaluated in a given time window repeatedly applied to the dynamic graph. The target edges correspond to particular different timestamps. The method further includes predicting a category of each of the target edges as being one of anomalous and non-anomalous based on the graph structure changes. The method also includes controlling a hardware based device to avoid an impending failure responsive to the category of at least one of the target edges.


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