The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
Jul. 12, 2021
Applicant:
Reservoir Labs, Inc., New York, NY (US);
Inventors:
Jordi Ros-Giralt, Newport Beach, CA (US);
Noah Amsel, New York, NY (US);
Sruthi Yellamraju, Germantown, MD (US);
Richard A. Lethin, New York, NY (US);
Assignee:
Reservoir Labs, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 47/762 (2022.01); H04L 47/74 (2022.01); H04L 47/80 (2022.01); H04L 47/78 (2022.01);
U.S. Cl.
CPC ...
H04L 47/745 (2013.01); H04L 47/748 (2013.01); H04L 47/762 (2013.01); H04L 47/781 (2013.01); H04L 47/801 (2013.01);
Abstract
A technique is described for quantifying a change in a system parameter in response to a perturbation of another system parameter. The technique identifies a region of influence of the perturbation and limits the propagation of the perturbation to the identified region.