The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

May. 10, 2021
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Anar Khetarpal, Santa Clara, CA (US);

Andrew Levy, San Mateo, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/22 (2022.01); H04L 43/06 (2022.01); H04L 43/0817 (2022.01); H04L 41/0246 (2022.01); H04L 41/142 (2022.01); H04L 43/0823 (2022.01); H04L 41/0654 (2022.01); H04L 43/04 (2022.01); H04L 43/067 (2022.01); H04L 43/045 (2022.01);
U.S. Cl.
CPC ...
H04L 41/22 (2013.01); H04L 41/0246 (2013.01); H04L 41/0654 (2013.01); H04L 41/142 (2013.01); H04L 43/04 (2013.01); H04L 43/045 (2013.01); H04L 43/06 (2013.01); H04L 43/067 (2013.01); H04L 43/0817 (2013.01); H04L 43/0823 (2013.01);
Abstract

Examples described herein include systems and methods for providing network insights on a graphical user interface ('GUI'). The GUI can visualize network errors to help administrative or information technology users more quickly identify issues with an enterprise application. The enterprise application can report network request information to a server. Then the GUI can present visual overlays that compare error metrics between different time cycles of the application. The visual overlay can graphically display these errors on top of one another for immediate relative visualization. Additionally, a grouped list of host destinations can be simultaneously provided. The destination addresses can be abbreviated, and errors grouped accordingly in a manner that provides advantageous error visualization.


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