The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
May. 15, 2020
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Kenneth Ho, Los Angeles, CA (US);
Jenet Peng, Gardena, CA (US);
Bennett Naden, Los Angeles, CA (US);
Alyse C. Bowers, Torrance, CA (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H01Q 1/24 (2006.01); H01Q 3/26 (2006.01); H01Q 21/22 (2006.01); H01Q 21/00 (2006.01);
U.S. Cl.
CPC ...
H04B 7/0617 (2013.01); H01Q 1/246 (2013.01); H01Q 3/26 (2013.01); H01Q 21/0006 (2013.01); H01Q 21/22 (2013.01);
Abstract
Methods and apparatus for providing a generic beamforming system. A first beamforming level can process digitized array data to form subarrays and output subarray data for the formed subarrays. A second beamforming level can process the subarray data to form beams and output beamforming data for a plurality of modules. A third beamforming level can process the beamforming data to process the beamforming data and generate formed beams for the array.