The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Mar. 20, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yasuo Bamba, Tokyo, JP;

Kotaro Yano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/52 (2022.01); G06V 10/50 (2022.01); G06V 10/75 (2022.01); G06T 7/11 (2017.01); G06T 7/215 (2017.01);
U.S. Cl.
CPC ...
G06V 20/53 (2022.01); G06T 7/11 (2017.01); G06T 7/215 (2017.01); G06V 10/50 (2022.01); G06V 10/75 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30232 (2013.01); G06T 2207/30236 (2013.01);
Abstract

An image processing apparatus including a determination unit configured to determine, for each of a plurality of partial areas set in an input image, a priority for executing a first image analysis process, based on an image of the partial area and a corresponding image corresponding to the partial area, the corresponding image being in a past image analyzed before the input image, a selection unit configured to select at least one of partial areas from the plurality of partial areas, based on the determined priority, and a first analysis unit configured to execute the first image analysis process on each of the at least one of partial areas selected.


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