The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
Feb. 11, 2021
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Ariel Beck, Singapore, SG;
Chandra Suwandi Wijaya, Singapore, SG;
Athul M. Mathew, Singapore, SG;
Nway Nway Aung, Singapore, SG;
Ramdas Krishnakumar, Singapore, SG;
Zong Sheng Tang, Singapore, SG;
Yao Zhou, Singapore, SG;
Pradeep Rajagopalan, Singapore, SG;
Yuya Sugasawa, Osaka, JP;
Abstract
A method and system for checking data gathering conditions or image capturing conditions associated with images during AI based visual-inspection process. The method comprises generating a first representative (FR) image for a first group of images and a second representative image (FR) for a second group of images. A difference image data is generated between FRimage and the FRimage based on calculating difference between luminance values of pixels with same coordinate values. Thereafter, one or more of a plurality of white pixels or intensity-values are determined within the difference image based on acquiring difference image data formed of luminance difference-values of pixels. An index representing difference of data-capturing conditions across the FRimage and the FRimage is determined, said index having been determined at least based on the plurality of white pixels or intensity-values, for example, based on application of a plurality of AI or ML techniques.