The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Mar. 09, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kentarou Sasaski, Tokyo, JP;

Daniel Georg Andrade Silva, Tokyo, JP;

Yotaro Watanabe, Tokyo, JP;

Kunihiko Sadamasa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06Q 40/02 (2012.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01); G06F 17/18 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 5/045 (2013.01); G06F 17/18 (2013.01); G06K 9/626 (2013.01); G06N 20/00 (2019.01);
Abstract

An inference method according to the present invention in an inference system inferring a probability that an ending state holds based on a starting state and a rule set, the method includes: when a rule set derived by excluding one rule from rules constituting a first rule set is set as a second rule set, a probability that the ending state holds based on the starting state and the first rule set is set as a first inference result, and a probability that the ending state holds based on the starting state and the second rule set is set as a second inference result, calculating an importance being an indicator indicating magnitude of a difference between the first inference result and the second inference result; and outputting the rule and the importance of the rule, being associated with each other for each of the excluded rule.


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