The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Jan. 29, 2021
Applicant:

Uipath, Inc., New York, NY (US);

Inventors:

Roeland Johannus Scheepens, Eindhoven, NL;

Dennis Brons, Eindhoven, NL;

Assignee:

UiPath, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 5/04 (2006.01); G06N 5/00 (2006.01); G06Q 10/06 (2012.01); G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 11/3447 (2013.01); G06F 11/3476 (2013.01); G06F 11/3495 (2013.01); G06F 11/3608 (2013.01); G06F 11/3636 (2013.01); G06N 5/003 (2013.01); G06Q 10/0633 (2013.01);
Abstract

Systems and methods for splitting an event log into sub-event logs are provided. The event log of a process is received. An activity relation score for a parallel relationship operator is calculated for each respective pair of activities of a plurality of pairs of activities in the event log based on 1) a frequency of occurrence of a first activity of the respective pair of activities between occurrences of a second activity of the respective pair of activities and 2) a frequency of occurrence of the second activity between occurrences of the first activity. A cut location in the event log is determined based on the activity relation scores. The event log is split into the sub-event logs based on the cut location.


Find Patent Forward Citations

Loading…