The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Feb. 06, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rachamalla Anirudh Reddy, Warangal, IN;

Pranay Kumar Lohia, Bhagalpur, IN;

Samiulla Zakir Hussain Shaikh, Bangalore, IN;

Diptikalyan Saha, Bangalore, IN;

Sameep Mehta, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06F 16/2457 (2019.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 16/24575 (2019.01); G06N 3/0445 (2013.01); G06N 3/0454 (2013.01);
Abstract

Methods, systems, and computer program products for generating explanations for a semantic parser are provided herein. A computer-implemented method includes providing to a generative model (i) at least one query and (ii) a context of at least one dataset applicable to the at least one query, wherein the generative model generates a plurality of perturbations for the at least one input query based on the context; providing the plurality of perturbations as inputs to a context aware sequence-to-sequence model, thereby obtaining a plurality of outputs; and generating, for (i) an additional query provided as input to the context aware sequence-to-sequence model and (ii) a context applicable to the additional query, an explanation indicative of one or more parts of the additional query that contributes to an output corresponding to the additional query, based at least in part on the plurality of outputs corresponding to the perturbations.


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