The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Sep. 25, 2019
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Toshiba Digital Solutions Corporation, Kawasaki, JP;

Inventor:

Toshiyuki Katou, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 11/30 (2006.01); G06F 11/32 (2006.01); G06N 3/04 (2006.01); G06F 17/16 (2006.01); G06K 9/62 (2022.01); G06F 9/54 (2006.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/302 (2013.01); G06F 9/542 (2013.01); G06F 11/321 (2013.01); G06F 17/16 (2013.01); G06K 9/6256 (2013.01); G06N 3/02 (2013.01); G06N 3/04 (2013.01); G06F 2101/14 (2013.01);
Abstract

An anomaly detection device according to the embodiment includes a prediction unit and an anomaly score calculation unit. The prediction unit performs a process to obtain, at each time step of the time series data of m dimensions, distribution parameters required to express a continuous probability distribution representing a distribution state of predicted values that can be obtained at a time step t of the time series data of m dimensions. The anomaly score calculation unit performs a process to calculate, using distribution parameters obtained by the prediction unit, an anomaly score corresponding to an evaluation value representing evaluation of a magnitude of anomaly in an actual measurement value at the time step t of time series data of m dimensions.


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