The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
Jun. 24, 2020
Koninklijke Philips N.v., Eindhoven, NL;
Sietse Menno Rispens, Utrecht, NL;
Warner Rudolph Theophile Ten Kate, Waalre, NL;
Janneke Annegarn, Eindhoven, NL;
Salvatore Saporito, Rotterdam, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
According to an aspect, there is provided a computer-implemented method for evaluating movement of a subject. The method comprises obtaining a first signal representing measurements of the subject from a first sensor; processing the first signal to determine a quality measure for the first signal; determining if the determined quality measure meets a first criterion; if the determined quality measure meets the first criterion, determining values for a plurality of features in a first feature set, the first feature set comprising one or more first features to be determined from the first signal, and evaluating the movement of the subject based on the values for the plurality of features in the first feature set; and, if the determined quality measure does not meet the first criterion, determining values for one or more features in a second feature set, wherein the one or more features in the second feature set are a subset of the plurality of features in the first feature set and the second feature set does not include at least one of the one or more first features in the first feature set, and evaluating the movement of the subject based on the values for the one or more features in the second feature set. A corresponding apparatus and computer program product are also provided.