The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Sep. 08, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yuuki Kurokawa, Yamanashi-ken, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G05B 19/18 (2006.01); G05B 19/404 (2006.01); G06N 20/00 (2019.01); G05B 19/418 (2006.01); G05B 19/4093 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G05B 19/182 (2013.01); G05B 19/404 (2013.01); G06N 20/00 (2019.01); G05B 19/40932 (2013.01); G05B 19/41875 (2013.01); G05B 2219/45151 (2013.01); G06T 7/70 (2017.01);
Abstract

A machine learning apparatus includes a first information acquiring unit that acquires first information including at least one of a shape of a workpiece, a material of the workpiece, a cutting path of a cutting process, a type of a tool, and an amount of wear of the tool; a second information acquiring unit that acquires second information correlated with an evaluation of a burr occurring on the workpiece due to the cutting process; and a learning unit that executes learning processing using a plurality of pieces of the first information and a plurality of pieces of the second information, and generates a learning model that outputs a cutting condition, according to another piece of first information that is different from the plurality of pieces of first information.


Find Patent Forward Citations

Loading…