The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Apr. 16, 2019
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Werner Knebel, Kronau, DE;

Wolfgang Oestreicher, Mannheim, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/10 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/10 (2013.01); G01N 21/6458 (2013.01); G02B 21/002 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/0084 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01);
Abstract

A SPIM-microscope (Selective Plane Imaging Microscopy) and a method of operating the same having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. An electronic zoom is provided that is adapted to change the scanning length in the x-direction independently of a focal length of the illumination light beam and a size of the light sheet in the y-direction and in the z-direction, wherein the number of image pixels in x-direction is maintained unchanged by the electronic zoom independently of the scanning length in x-direction that has been selected.


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