The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Jul. 15, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takashi Sukegawa, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1885 (2013.01); G02B 5/1852 (2013.01); G02B 5/1857 (2013.01);
Abstract

A diffraction device includes a ZnS member and a ZnSe member coupled to the ZnS member, and a diffraction grating is provided on the ZnSe member.


Find Patent Forward Citations

Sukegawa, Takashi. (2022). Diffraction device, spectroscopic apparatus, and manufacturing method of diffraction device (U.S. Patent No. 11520090). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11520090

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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