The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
May. 10, 2021
Applicant:
Hidex Oy, Turku, FI;
Inventors:
Petri Aronkyto, Raisio, FI;
Eveliina Arponen, Turku, FI;
Ville Haaslahti, Turku, FI;
Risto Juvonen, Saklya, FI;
Timo Oikari, Turku, FI;
Assignee:
Hidex Oy, Turku, FI;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/178 (2006.01); G01T 1/204 (2006.01);
U.S. Cl.
CPC ...
G01T 1/178 (2013.01); G01T 1/204 (2013.01); G01T 1/2045 (2013.01);
Abstract
The present invention provides a method for determining a background count rate in liquid scintillation counting. The method comprises measuring an external standard spectrum () of a sample, determining, from the external standard spectrum, an external standard count rate within an energy window (), determining, based on the external standard count rate within the energy window, a background reference parameter, and determining, based on the background reference parameter, the background count rate from a background reference curve ().