The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

May. 11, 2021
Applicant:

Institute of Electronics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Heng Zhang, Beijing, CN;

Yu Wang, Beijing, CN;

Tingzhu Fang, Beijing, CN;

Da Liang, Beijing, CN;

Haoyu Lin, Beijing, CN;

Yunkai Deng, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9058 (2019.05); G01S 13/9011 (2013.01); G01S 13/9029 (2013.01);
Abstract

A method for space-variance correction imaging of BiSAR includes: motion parameters corresponding to a target point in an equivalent monostatic mode are calculated using a first motion trajectory, a second motion trajectory and an imaging parameter for focusing a radar echo signal, the target point at least including a center point of an imaging scene; azimuth Doppler center bias correction is performed on the radar echo signal by using the motion parameters corresponding to the center point; uniform and residual range cell migration correction is performed on a corrected signal, range blocking is performed, and range space-variance phase errors are corrected block by block; azimuth blocking is performed, and a corresponding number of filters are constructed for filtering processing; and inverse Doppler center bias correction is further performed to obtain a final imaging result graph.


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