The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Jun. 03, 2021
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventor:

John Sandusky, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 3/782 (2006.01); G06T 7/00 (2017.01); H04N 7/18 (2006.01); B64D 47/08 (2006.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01S 3/782 (2013.01); B64D 47/08 (2013.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 7/97 (2017.01); H04N 7/188 (2013.01); G06T 2207/10016 (2013.01);
Abstract

A laser-strike detection system includes an imaging sensor mounted on a platform, and a computing device. The imaging sensor outputs image frames that are each representative of a portion of the platform at a different time, during which a laser may be striking the platform. The computing device receives the image frames, and computes a delay map that indicates time-of-arrival delays of the laser beam at points on the portion of the platform. The computing device converts the delay map to a path-length variation map by multiplying the delay map by the propagation speed of light. The computing device fits a plane to the path-length variation map constrained by a topological model of the platform. The computing device computes angular deflections in x- and y-directions based upon the fit, which angular deflections define a direction from the platform to an emitter of the laser beam.


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