The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Dec. 09, 2019
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

George Randall Duensing, Hamburg, DE;

Sascha Krueger, Hamburg, DE;

Christian Findeklee, Norderstedt, DE;

Oliver Lips, Hamburg, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/3415 (2006.01); G01R 33/28 (2006.01); G01R 33/36 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3415 (2013.01); G01R 33/283 (2013.01); G01R 33/3628 (2013.01);
Abstract

A radio frequency (RF) system comprises an RF-array of antenna elements, a regulating arrangement to tune the antenna elements' impedances and a camera system to acquire image information of the RF-array. An analysis module is provided to derive operational settings such as resonant tuning settings, decoupling and impedance matchings of the antenna elements' impedances from the image information. The image information also represents the actual impedances and resonant properties of the RF-array. From the image information appropriate impedance settings can be derived that are the tuning parameters to render the RF-array resonant.


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