The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Nov. 08, 2021
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Kaixin Yuan, Beijing, CN;

Aiming Du, Beijing, CN;

Ying Zhang, Beijing, CN;

Lin Zhao, Beijing, CN;

Shuquan Sun, Beijing, CN;

Xiao Feng, Beijing, CN;

Zhi Li, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/04 (2006.01); G01R 33/02 (2006.01); G01C 17/30 (2006.01); G01C 17/28 (2006.01); G01C 17/38 (2006.01);
U.S. Cl.
CPC ...
G01R 33/04 (2013.01); G01R 33/02 (2013.01); G01R 33/0206 (2013.01); G01R 33/045 (2013.01); G01C 17/28 (2013.01); G01C 17/30 (2013.01); G01C 17/38 (2013.01);
Abstract

An offset data acquisition method and device of a fluxgate magnetometer are provided by the present disclosure, wherein the offset data acquisition method of the fluxgate magnetometer comprises: controlling the first analog switch, the second analog switch and the third analog switch to change directions within a preset period to obtain eight switch direction combinations between the first analog switch, the second analog switch and the third analog switch; acquiring magnetic field measurement data corresponding to an each of the switch direction combinations; and the magnetic field measurement data comprises x-axis magnetic field measurement data, y-axis magnetic field measurement data and z-axis magnetic field measurement data; and acquiring the offset data based on influence factors of an offset and the magnetic field measurement data within the preset period.


Find Patent Forward Citations

Loading…