The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Aug. 24, 2021
Applicant:

Realtek Semiconductor Corporation, Hsinchu, TW;

Inventors:

Jeong-Fa Sheu, Hsinchu, TW;

Chen-Kuo Hwang, Hsinchu, TW;

Mei-Chuan Lu, Hsinchu, TW;

Wei-Chung Cho, Hsinchu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01); G01R 31/3187 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/3183 (2013.01); G01R 31/3187 (2013.01); G01R 31/318307 (2013.01); G01R 31/318502 (2013.01); G01R 31/318533 (2013.01); G01R 31/318536 (2013.01); G01R 31/318541 (2013.01); G01R 31/318566 (2013.01);
Abstract

A test circuit for testing an integrated circuit includes a plurality of normal flip flops and a modified flip flop, wherein the integrated circuit includes a black box circuit and a plurality of combinational logic circuits. The normal flip flops each includes a first input pin, a second input pin and a first output pin and is configured to temporarily store the input value of the first input pin or the input value of the second input pin according to a scan enable signal. The modified flip flop includes a third input pin, a fourth input pin and a second output pin which are coupled to the black box circuit, the normal flip flops and the combinational logic circuits and is configured to temporarily store the input value of the third input pin or the input value of the fourth input pin according to a scan test mode signal.


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