The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
Jun. 26, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Vincent Abadie, Munich, DE;
Ramez Khoury, Munich, DE;
Corbett Rowell, Munich, DE;
Jose Fortes, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The present disclosure relates to a measurement system for testing a device under test over-the-air. The measurement system comprises a signal generation and/or analysis equipment, several antennas, several reflectors and a test location for the device under test. The antennas are connected with the signal generation and/or analysis equipment in a signal-transmitting manner Each of the antennas is configured to transmit and/or receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by one of the reflectors so that the electromagnetic signal corresponds to a planar wave, thereby providing indirect far field conditions for testing. A first reflector of the several reflectors is orientated at a first azimuth angle and at a first elevation angle with respect to a center of the test location. A second reflector of the several reflectors is orientated at a second azimuth angle and at a second elevation angle with respect to the center of the test location. The second elevation angle is different to the first elevation angle. The second azimuth angle is different to the first azimuth angle. Further, a method of performing an over-the-air test of a device under test is described.