The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

May. 16, 2017
Applicant:

Siemens Healthineers Nederland B.v., The Hague, NL;

Inventors:

Alexander Van Reenen, Vught, NL;

Markus Hendrikus Van Roosmalen, Berkel-Enschot, NL;

Hendrik Sibolt Van Damme, s-Hertogenbosch, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); B01L 3/50273 (2013.01); B01L 3/502715 (2013.01); B01L 2300/06 (2013.01); B01L 2300/0809 (2013.01); B01L 2300/0851 (2013.01); B01L 2300/168 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/049 (2013.01); G01N 2021/0346 (2013.01);
Abstract

The present invention relates to a device () for use in fluid sample analysis. It is described to position () a top part () of the device () adjacent to a base part () of the device so as to define a fluidic receiving region in between, the top part being provided with a through opening fluidly connected to the fluidic receiving region, and the bottom part being provided with a radiation window adjacent to the fluidic receiving region. A fluidic sample is supplied () through the opening (). The fluidic sample is moved laterally () in the fluid receiving region without the use of an intermediary membrane between the top part and the base part. A radiation is emitted () to the fluid receiving region. A radiation is detected () that is reflected by the device. A presence of the fluidic sample is determined () on the basis of a measured reflectance value based on the detected radiation.


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