The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Aug. 07, 2019
Applicant:

Central Japan Railway Company, Aichi, JP;

Inventors:

Masashi Itoyama, Aichi, JP;

Takeshi Narita, Aichi, JP;

Naotaka Kumagai, Aichi, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/08 (2006.01); G01M 17/10 (2006.01); B61K 9/04 (2006.01); G01K 1/02 (2021.01);
U.S. Cl.
CPC ...
G01M 17/10 (2013.01); B61K 9/04 (2013.01); G01K 1/026 (2013.01);
Abstract

A temperature abnormality detection system includes: measurement devices; and a processor to determine temperature abnormality using a first temperature T, a second temperature T, and a third temperature T. The processor determines occurrence of temperature abnormality when any one of following conditions is satisfied:


Find Patent Forward Citations

Itoyama, Masashi. (2022). Temperature abnormality detection system and temperature abnormality detection method (U.S. Patent No. 11519825). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11519825

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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