The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Nov. 15, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Koichiro Yamashita, Hachioji, JP;

Takahisa Suzuki, Yokohama, JP;

Koji Kurihara, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E01C 23/01 (2006.01); E01D 22/00 (2006.01); G01D 3/08 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01D 21/00 (2013.01); E01C 23/01 (2013.01); E01D 22/00 (2013.01); G01D 3/08 (2013.01);
Abstract

When the measurement values measured by a first sensor among a plurality of sensors installed in a dispersed manner at a specific location, in first cycles are determined to be abnormal values, a control device activates the first sensor in second cycles that are shorter than the first cycles. Moreover, when the abnormal values are included in the trend of temporal variation, the control device activates a plurality of second sensors, which is installed around the first sensor, in the second cycles. Moreover, when the measurement values measured by the first sensor and the plurality of second sensors in the second cycles are included in the trend of surface-direction distribution, the control device outputs the measurement values measured by the first sensor and the plurality of second sensors.


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