The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Mar. 29, 2017
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Sergio Puigardeu Aramendia, Sant Cugat del Valles, ES;

Adrien Chiron, Sant Cugat del Valles, ES;

Daniel Pablo Rosenblatt, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/165 (2017.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/165 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

Examples of a method of operating an additive manufacturing system, a three-dimensional (3D) printing system and a non-transitory machine-readable medium are described. In an example, a build material is supplied to a print region of an additive manufacturing system. A temperature distribution, corresponding to a pattern, of at least a surface of the build material is generated. An image of the pattern is captured using a thermal sensor. Image data representative of the image of the pattern is compared with data representative of an expected position of the pattern. On the basis of the comparing, difference data indicative of a difference between a position of the thermal sensor during capture of the image and an expected position of the thermal sensor associated with the expected position of the pattern is generated. Operation of the additive manufacturing system is controlled at least in dependence on the difference data.


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