The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Nov. 26, 2018
Applicant:

Additive Industries B.v., Eindhoven, NL;

Inventors:

Mark Herman Else Vaes, Eindhoven, NL;

Steef Willem Denteneer, Eindhoven, NL;

Erwin Wijn, Eindhoven, NL;

Assignee:

ADDITIVE INDUSTRIES B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); B29C 64/268 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01);
U.S. Cl.
CPC ...
B29C 64/268 (2017.08); B29C 64/153 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

The invention relates to an apparatus for producing an object by means of additive manufacturing, comprising a process chamber for receiving a bath of material which can be solidified by exposure to electromagnetic radiation; a support for positioning the object in relation to the surface level of the bath of material; and a solidifying device for solidifying a selective layer-part of the material on the surface level by means of electromagnetic radiation. Furthermore optical control device is provided with a focus unit in an optical pathway of the electromagnetic radiation of the solidifying device, and arranged for controlling at least the focus of the electromagnetic radiation emitted by the solidifying device on the surface level. According to the invention, the optical control device comprises a sensor element arranged for detecting a measure for the accuracy of the focus of the electromagnetic radiation and a focus correction lens element that is arranged to be movable. By moving said focus correction lens element, focus may be corrected, for example due to thermal behaviour of the optical system.


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