The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Nov. 06, 2018
Applicant:

Sigma Labs, Inc., Santa Fe, NM (US);

Inventors:

Lars Jacquemetton, Santa Fe, NM (US);

Vivek R. Dave, Concord, NH (US);

Mark J. Cola, Santa Fe, NM (US);

Glenn Wikle, Santa Fe, NM (US);

R. Bruce Madigan, Butte, MT (US);

Assignee:

SIGMA LABS, INC., Santa Fe, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 31/12 (2006.01); B22F 12/00 (2021.01); B23K 26/342 (2014.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B23K 31/125 (2013.01); B22F 12/00 (2021.01); B23K 26/342 (2015.10); B33Y 10/00 (2014.12);
Abstract

This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.


Find Patent Forward Citations

Loading…