The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Jul. 18, 2019
Applicant:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Inventors:

Sven Ebert, Rotkreuz, CH;

Paul Federer, Rotkreuz, CH;

Pius Hermann, Rotkreuz, CH;

Stefan Vollenweider, Rotkreuz, CH;

Assignee:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 7/00 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
B01L 7/52 (2013.01); G01N 25/00 (2013.01); B01L 2200/147 (2013.01); B01L 2300/0627 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/1822 (2013.01); B01L 2300/1827 (2013.01);
Abstract

A method to monitor and control the temperature of a sample holder of a laboratory instrument during execution of a temperature profile on the sample holder is presented. The laboratory instrument comprises a sample holder with high temperature uniformity and at least three identical temperature sensors. The measured actual temperatures of the sample holder are processed in order to determine if the execution of the temperature profile should be continued or aborted. Furthermore, temperature sensors which measure actual temperatures that do not fulfil certain requirements are excluded from further monitoring and controlling the temperature of a sample holder.


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