The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Jan. 15, 2019
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Min-Hyung Cho, Daejeon, KR;

Young-deuk Jeon, Sejong, KR;

Bon Tae Koo, Daejeon, KR;

Mun Yang Park, Daejeon, KR;

Youngseok Baek, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0537 (2021.01); G01N 27/02 (2006.01); A61B 5/00 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0537 (2013.01); A61B 5/4869 (2013.01); A61B 5/7278 (2013.01); G01N 27/028 (2013.01); G01N 33/4833 (2013.01); A61B 5/7225 (2013.01);
Abstract

The inventive concept relates to a body composition analysis system. A body composition analysis system according to an embodiment of the inventive concept includes a sinusoidal signal generator, a synchronous detector, and a bioimpedance analyzer. The sinusoidal signal generator converts a digital sinusoidal signal having a target frequency into an analog sinusoidal signal. The synchronous detector extracts a target frequency component of a bioelectrical signal generated in response to an analog sinusoidal signal based on the digital sinusoidal signal. The bioimpedance analyzer calculates the bioimpedance based on the target frequency component of the bioelectrical signal. According to the inventive concept, it is possible to improve the selectivity for extracting the target frequency component of the bioelectrical signal and to reduce the area and variations of characteristics for the implementation of the integrated circuit.


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