The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Mar. 04, 2020
Applicant:

Cloudminds (Shenzhen) Robotics Systems Co., Ltd., Guangdong, CN;

Inventors:

Huakun Cui, Guangdong, CN;

Kai Wang, Guangdong, CN;

Shiguo Lian, Guangdong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/08 (2006.01); A61B 3/00 (2006.01); A61B 5/11 (2006.01);
U.S. Cl.
CPC ...
A61B 3/08 (2013.01); A61B 3/005 (2013.01); A61B 3/0025 (2013.01); A61B 3/0091 (2013.01); A61B 5/1114 (2013.01);
Abstract

A panum's area measurement method includes: projecting a first parallax image of a spatial object to the left eye of a user under test, and projecting a second parallax image of the spatial object to the right eye of the user under test, the first parallax image comprising a first homologous point and the second parallax image comprising a second homologous point; adjusting a horizontal parallax amount between the first homologous point and the second homologous point until the user under test observes the spatial object producing a ghost; acquiring a parallax amount parameter Δn; calculating a horizontal physical spacing Δx between the first homologous point and the second homologous point based on the parallax amount parameter Δn; and calculating a panum's area range (μ, μ) of the user under test based on the horizontal physical spacing Δx.


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