The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Mar. 30, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Sonya Chang, Jr., San Mateo, CA (US);

Maxime Petazzoni, San Mateo, CA (US);

Joseph Ross, Redwood City, CA (US);

Sahinaz Safari Sanjani, San Francisco, CA (US);

Assignee:

SPLUNK Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 65/65 (2022.01); G06F 16/9035 (2019.01); G06F 16/901 (2019.01); G06F 16/907 (2019.01); H04L 65/61 (2022.01);
U.S. Cl.
CPC ...
H04L 65/65 (2022.05); G06F 16/907 (2019.01); G06F 16/9024 (2019.01); G06F 16/9035 (2019.01); H04L 65/61 (2022.05);
Abstract

A method of diagnosing anomalous patterns from metrics data associated with a microservices-based application comprises aggregating a plurality of ingested spans into a plurality of streams of metric data. The method also comprises performing computations on a stream of metric data from the plurality of streams of metric data to identify an anomalous pattern. Further, the method comprises generating an alert in response to the anomalous pattern and querying a data set using metadata associated with the alert to retrieve additional information pertaining to the anomalous pattern.


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