The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Dec. 14, 2021
Applicant:
Mediatek Inc., Hsin-Chu, TW;
Inventors:
Assignee:
MEDIATEK INC., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/29 (2015.01);
Abstract
A testing method for determining radiation performance of a device under test (DUT) is disclosed. The testing method comprises the following steps. The DUT is arranged at a first orientation. A first effective isotropic radiated power (EIRP) and a first effective isotropic sensitivity (EIS) of the DUT are measured at the first orientation. The DUT is arranged at a second orientation different from the first orientation, and a second EIRP of the DUT is measured at the second orientation. A second EIS of the DUT is measured at the second orientation according to a correlation between the first EIRP, the first EIS and the second EIRP.