The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Jul. 01, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventor:

Takahiro Kawabe, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 13/80 (2011.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 13/80 (2013.01); G06T 3/0012 (2013.01); G06T 2210/24 (2013.01);
Abstract

A visual perception of an arbitrary transparent material is imparted to an arbitrary image. In accordance with each element of each deformation map included in a sequence of deformation maps that correspond to a time series, each element of a target image is moved to obtain each deformed image of the time series. Each element of each of the deformation maps indicates a movement direction and a movement amount of each pixel of the target image corresponding to the element. Each deformation map included in a sequence of deformation maps corresponding to a first time interval in the time series corresponds to each of two-dimensional arrays obtained by moving, in a first direction, elements of two-dimensional arrays corresponding to immediately-previous deformation maps, and each deformation map included in a sequence of deformation maps corresponding to a second time interval in the time series corresponds to each of two-dimensional arrays obtained by moving, in a second direction, elements of two-dimensional arrays corresponding to immediately-previous deformation maps. Here, the first direction and the second direction differ from one another.


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