The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Mar. 16, 2020
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Charlotte Delmas, Paris, FR;

Jorge Corsino Espino, Paris, FR;

Razvan Iordache, Paris, FR;

Serge Calisti, Marseilles, FR;

Laurence Vancamberg, Poissy, FR;

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 6/02 (2006.01); A61B 6/04 (2006.01); A61B 6/12 (2006.01); A61B 10/02 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); A61B 6/025 (2013.01); A61B 6/0414 (2013.01); A61B 6/12 (2013.01); A61B 6/461 (2013.01); A61B 6/502 (2013.01); A61B 6/582 (2013.01); A61B 10/0275 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10112 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30068 (2013.01);
Abstract

Methods and systems are provided for reconstruction error assessment for an interventional tool utilized in an image guided interventional procedure. In one example, an error model based on a target lesion position within a tissue, one or more interventional tool parameters, and imaging system parameters may be utilized to estimate an expected reconstruction error for the interventional tool. In another example, when the interventional tool is within the tissue, the expected reconstruction error may be utilized along with observed tool shape and size to infer an actual tool position and shape within the tissue.


Find Patent Forward Citations

Delmas, Charlotte. (2022). Methods and systems for biopsy needle reconstruction error assessment (U.S. Patent No. 11514624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11514624

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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